Berke Erbas

Publication Activity (10 Years)

Years Active: 2024-2024
Publications (10 Years): 5

Top Topics

Molecular Dynamics Simulations

Risk Assessment

Top Venues

Nature communications

Microsystems & nanoengineering

This page only lists publications with an associated author ORCID identifier.

Publications

Berke Erbas, Ana Conde-Rubio, Xia Liu, Joffrey Pernollet, Zhenyu Wang, Arnaud Bertsch, Marcos Penedo, Georg Ernest Fantner, Mitali Banerjee, Andras Kis, Giovanni Boero, Juergen Brugger
Combining thermal scanning probe lithography and dry etching for grayscale nanopattern amplification. Microsystems & nanoengineering 10 (2024)
Xia Liu, Berke Erbas, Ana Conde-Rubio, Norma Rivano, Zhenyu Wang, Jin Jiang, Siiri Bienz, Naresh Kumar, Thibault Sohier, Marcos Penedo, Mitali Banerjee, Georg Ernest Fantner, Renato Zenobi, Nicola Marzari, Alberto Ciarrocchi, Giovanni Boero, Juergen Brugger
Deterministic grayscale nanotopography to engineer mobilities in strained MoS 2 FETs. Nature communications 15 (1) (2024)
Berke Erbas, Ana Conde-Rubio, Xia Liu, Joffrey Pernollet, Zhenyu Wang, Arnaud Bertsch, Marcos Penedo, Georg Ernest Fantner, Mitali Banerjee, Andras Kis, Giovanni Boero, Juergen Brugger
Combining thermal scanning probe lithography and dry etching for grayscale nanopattern amplification. Microsystems & nanoengineering 10 (2024)
Xia Liu, Berke Erbas, Ana Conde-Rubio, Norma Rivano, Zhenyu Wang, Jin Jiang, Siiri Bienz, Naresh Kumar, Thibault Sohier, Marcos Penedo, Mitali Banerjee, Georg Ernest Fantner, Renato Zenobi, Nicola Marzari, Alberto Ciarrocchi, Giovanni Boero, Juergen Brugger
Deterministic grayscale nanotopography to engineer mobilities in strained MoS 2 FETs. Nature communications 15 (1) (2024)
Xia Liu, Berke Erbas, Ana Conde-Rubio, Norma Rivano, Zhenyu Wang, Jin Jiang, Siiri Bienz, Naresh Kumar, Thibault Sohier, Marcos Penedo, Mitali Banerjee, Georg Ernest Fantner, Renato Zenobi, Nicola Marzari, Alberto Ciarrocchi, Giovanni Boero, Juergen Brugger
Deterministic grayscale nanotopography to engineer mobilities in strained MoS 2 FETs. Nature communications 15 (1) (2024)