Ivan Povstugar

Scopus Author ID Scopus Author ID Scopus Author ID ORCID

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 5

Top Topics

Reduced Graphene Oxide

Room Temperature

Electron Microscopy

Top Venues

ACS applied materials & interfaces

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

This page only lists publications with an associated author ORCID identifier.

Publications

Mane Kaladzhian, Nils von den Driesch, Nataliya Demarina, Ivan Povstugar, Erik Zimmermann, Marvin Marco Jansen, Jin Hee Bae, Christoph Krause, Benjamin Bennemann, Detlev Grützmacher, Thomas Schäpers, Alexander Pawlis
Growth and Electrical Characterization of Hybrid Core/Shell InAs/CdSe Nanowires. ACS applied materials & interfaces 16 (8) (2024)
Mane Kaladzhian, Nils von den Driesch, Nataliya Demarina, Ivan Povstugar, Erik Zimmermann, Marvin Marco Jansen, Jin Hee Bae, Christoph Krause, Benjamin Bennemann, Detlev Grützmacher, Thomas Schäpers, Alexander Pawlis
Growth and Electrical Characterization of Hybrid Core/Shell InAs/CdSe Nanowires. ACS applied materials & interfaces 16 (8) (2024)
Mane Kaladzhian, Nils von den Driesch, Nataliya Demarina, Ivan Povstugar, Erik Zimmermann, Marvin Marco Jansen, Jin Hee Bae, Christoph Krause, Benjamin Bennemann, Detlev Grützmacher, Thomas Schäpers, Alexander Pawlis
Growth and Electrical Characterization of Hybrid Core/Shell InAs/CdSe Nanowires. ACS applied materials & interfaces (2024)
Mane Kaladzhian, Nils von den Driesch, Nataliya Demarina, Ivan Povstugar, Erik Zimmermann, Marvin Marco Jansen, Jin Hee Bae, Christoph Krause, Benjamin Bennemann, Detlev Grützmacher, Thomas Schäpers, Alexander Pawlis
Growth and Electrical Characterization of Hybrid Core/Shell InAs/CdSe Nanowires. ACS applied materials & interfaces 16 (8) (2024)
Ivan Povstugar, Juliane Weber, Dmitry Naumenko, Taihong Huang, Martina Klinkenberg, Willem J Quadakkers
Correlative Atom Probe Tomography and Transmission Electron Microscopy Analysis of Grain Boundaries in Thermally Grown Alumina Scale. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 25 (1) (2019)