Jari Domke

Publication Activity (10 Years)

Years Active: 2019-2022
Publications (10 Years): 7

Top Topics

Walled Carbon Nanotubes

Metal Organic Framework

Top Venues

Acta crystallographica. Section A, Foundations and advances

Beilstein journal of nanotechnology

Journal of applied crystallography

Nature materials

This page only lists publications with an associated author ORCID identifier.

Publications

Junzhu Li, Mingguang Chen, Abdus Samad, Haocong Dong, Avijeet Ray, Junwei Zhang, Xiaochuan Jiang, Udo Schwingenschlögl, Jari Domke, Cailing Chen, Yu Han, Torsten Fritz, Rodney S Ruoff, Bo Tian, Xingzhong Zhao
Wafer-scale single-crystal monolayer graphene grown on sapphire substrate. Nature materials 21 (7) (2022)
Josef Simbrunner, Jari Domke, Falko Sojka, Andreas Jeindl, Felix Otto, Marco Gruenewald, Oliver T Hofmann, Torsten Fritz, Roland Resel, Roman Forker
Correlation between two- and three-dimensional crystallographic lattices for epitaxial analysis. II. Experimental results. Acta crystallographica. Section A, Foundations and advances 78 (Pt 3) (2022)
Josef Simbrunner, Jari Domke, Roman Forker, Roland Resel, Torsten Fritz
Correlation between two- and three-dimensional crystallographic lattices for epitaxial analysis. I. Theory. Acta crystallographica. Section A, Foundations and advances 78 (Pt 3) (2022)
Andreas Jeindl, Jari Domke, Lukas Hörmann, Falko Sojka, Roman Forker, Torsten Fritz, Oliver T Hofmann
Nonintuitive Surface Self-Assembly of Functionalized Molecules on Ag(111). ACS nano 15 (4) (2021)
Maximilian Schaal, Takumi Aihara, Marco Gruenewald, Felix Otto, Jari Domke, Roman Forker, Hiroyuki Yoshida, Torsten Fritz
Hybridization vs decoupling: influence of an h-BN interlayer on the physical properties of a lander-type molecule on Ni(111). Beilstein journal of nanotechnology 11 (2020)
Josef Simbrunner, Benedikt Schrode, Jari Domke, Torsten Fritz, Ingo Salzmann, Roland Resel
An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films. Acta crystallographica. Section A, Foundations and advances 76 (Pt 3) (2020)
Benedikt Schrode, Stefan Pachmajer, Michael Dohr, Christian Röthel, Jari Domke, Torsten Fritz, Roland Resel, Oliver Werzer
GIDVis: a comprehensive software tool for geometry-independent grazing-incidence X-ray diffraction data analysis and pole-figure calculations. Journal of applied crystallography 52 (Pt 3) (2019)