Konstantin V Nikolaev (Konstantin Nikolaev, K V Nikolaev)

Scopus Author ID ORCID

Publication Activity (10 Years)

Years Active: 2019-2022
Publications (10 Years): 3

Top Topics

Staphylococcus Aureus

Top Venues

Acta crystallographica. Section A, Foundations and advances

Small (Weinheim an der Bergstrasse, Germany)

Physikalisch-Technische Bundesanstalt in Berlin

University of Twente (PHD)

This page only lists publications with an associated author ORCID identifier.

Affiliation History

Physikalisch-Technische Bundesanstalt in Berlin Apr 01 2019

Germany

PostDoc :: 8.41 Mathematical modelling and data analysis

University of Twente

Netherlands

PhD student :: XUV Optics

Kurchatov Center for Synchrotron Radiation and Nanotechnology

Russia

Junior researcher

Education History

University of Twente

Netherlands

PHD :: XUV optics

National Research University of Electronic Technology

Russia

MSC :: Quantum physics and nano-electronics

National Research University of Electronic Technology

Russia

BSC :: Quantum physics and nano-electronics

Publications

Dieter Skroblin, Analía Fernández Herrero, Thomas Siefke, Konstantin V Nikolaev, Anna Andrle, Philipp Hönicke, Yves Kayser, Michael Krumrey, Christian Gollwitzer, Victor Soltwisch
Challenges of grazing emission X-ray fluorescence (GEXRF) for the characterization of advanced nanostructured surfaces. Nanoscale 14 (41) (2022)
Philipp Hönicke, Yves Kayser, Konstantin V Nikolaev, Victor Soltwisch, Jeroen E Scheerder, Claudia Fleischmann, Thomas Siefke, Anna Andrle, Grzegorz Gwalt, Frank Siewert, Jeffrey Davis, Martin Huth, Anabela Veloso, Roger Loo, Dieter Skroblin, Michael Steinert, Andreas Undisz, Markus Rettenmayr, Burkhard Beckhoff
Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures. Small (Weinheim an der Bergstrasse, Germany) (2021)
Konstantin V Nikolaev, S N Yakunin, I A Makhotkin, J de la Rie, R V Medvedev, A V Rogachev, I N Trunckin, A L Vasiliev, C P Hendrikx, M Gateshki, R W E van de Kruijs, F Bijkerk
Grazing-incidence small-angle X-ray scattering study of correlated lateral density fluctuations in W/Si multilayers. Acta crystallographica. Section A, Foundations and advances 75 (Pt 2) (2019)