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Model-free classification of X-ray scattering signals applied to image segmentation.

Viviane Lutz-BuenoC ArboledaL LeuM J BluntA BuschA GeorgiadisP BertierJ SchmatzZ VargaP Villanueva-PerezZ WangM LebugleC DavidM StampanoniA DiazManuel Guizar-SicairosA Menzel
Published in: Journal of applied crystallography (2018)
In most cases, the analysis of small-angle and wide-angle X-ray scattering (SAXS and WAXS, respectively) requires a theoretical model to describe the sample's scattering, complicating the interpretation of the scattering resulting from complex heterogeneous samples. This is the reason why, in general, the analysis of a large number of scattering patterns, such as are generated by time-resolved and scanning methods, remains challenging. Here, a model-free classification method to separate SAXS/WAXS signals on the basis of their inflection points is introduced and demonstrated. This article focuses on the segmentation of scanning SAXS/WAXS maps for which each pixel corresponds to an azimuthally integrated scattering curve. In such a way, the sample composition distribution can be segmented through signal classification without applying a model or previous sample knowledge. Dimensionality reduction and clustering algorithms are employed to classify SAXS/WAXS signals according to their similarity. The number of clusters, i.e. the main sample regions detected by SAXS/WAXS signal similarity, is automatically estimated. From each cluster, a main representative SAXS/WAXS signal is extracted to uncover the spatial distribution of the mixtures of phases that form the sample. As examples of applications, a mudrock sample and two breast tissue lesions are segmented.
Keyphrases
  • deep learning
  • high resolution
  • machine learning
  • convolutional neural network
  • electron microscopy
  • monte carlo
  • computed tomography
  • single cell
  • ionic liquid
  • rna seq