[Computed X-ray microtomography of the junction of dental implants with standard and custom abutments].

The results obtained demonstrate the capabilities of the computer X-ray microtomography method, which can be used to control the quality of manufacturing collapsible dental implants, the accuracy of manufacturing individual abutments in CAD/CAM laboratories, as well as in the development of new dental implant systems. The dimensional parameters of the junction node determine the advantages of the deep cone connection of the implant and the abutment.