Wiggler radiation at a low-emittance storage ring and its usage for X-ray absorption spectroscopy.

A wiggler is a high-power insertion device that was used in the past to produce a smooth wide-band X-ray spectrum. It is widely believed that on low-emittance synchrotrons this X-ray source loses its spatial and spectral homogeneity and therefore becomes less ideal than a scanning undulator. In this paper, we report on experimental and computational studies of an in-vacuum wiggler installed on the first fourth-generation synchrotron MAX IV. We investigate how several physical parameters affect the wiggler spectrum and propose a combination of a few of them that results in significant spectral smoothing. We also examine EXAFS spectra for possible distortions originating from the source imperfection. For this purpose, we scrutinize samples of various homogeneity. We conclude that wigglers are still an appropriate class of insertion devices, also on low-emittance synchrotrons.