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Author Correction: Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy.

Xuewen FuFrancesco BarantaniSimone GargiuloIvan MadanGabriele BerrutoThomas LaGrangeLei JinJunqiao WuGiovanni Maria VanacoreFabrizio CarboneYimei Zhu
Published in: Nature communications (2021)
Keyphrases
  • electron microscopy
  • atomic force microscopy
  • electron transfer