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SPIE Computer-Aided Diagnosis conference anniversary review.

Ronald M SummersMaryellen L Giger
Published in: Journal of medical imaging (Bellingham, Wash.) (2022)
The SPIE Computer-Aided Diagnosis conference has been held for 16 consecutive years at the annual SPIE Medical Imaging symposium. The conference remains vibrant, with a core group of submitters as well as new submitters and attendees each year. Recent developments include a marked shift in submissions relating to the artificial intelligence revolution in medical image analysis. This review describes the topics and trends observed in research presented at the Computer-Aided Diagnosis conference as part of the 50th-anniversary celebration of SPIE Medical Imaging.
Keyphrases
  • artificial intelligence
  • healthcare
  • high resolution
  • machine learning
  • big data
  • deep learning
  • mass spectrometry