A new precursor route for the growth of NbO2 thin films by chemical vapor deposition.

Niobium dioxide (NbO2) exhibits metal-insulator transition (Mott transition) and show the potential for application in memristors and neuromorphic devices. Presently growth of NbO2 thin films requires high-temperature reduction of Nb2O5 films using H2 or sophisticated techniques such as molecular beam epitaxy and pulsed laser deposition. The present study demonstrates a simple chemical route of the direct growth of crystalline NbO2 films by chemical vapor deposition (CVD) using a freshly prepared Nb-hexadecylamine (Nb-HDA) complex. X-ray diffraction studies confirm the NbO2 phase with a distorted rutile body-centered-tetragonal (BCT) structure and the film grown with a highly preferred orientation on c-sapphire. X-ray photoelectron spectroscopy (XPS) confirms the +4 oxidation state. The present method offers facile growth of NbO2 films without post-reduction steps which will be assumed to be a cost-effective process for NbO2 based devices.