Spatially compressed dual-wavelength Raman spectroscopy allows recording the full Raman spectrum using a detection system with limited spectral range. The common approach is to record the spectra with the two excitation lasers consecutively and then concatenate the full spectrum. However, with this approach, quantitative analysis for process monitoring is not possible as the investigated object may change between the two acquisitions. In this Note, spectral fusion is proposed as a concept to overcome this problem. The sample is illuminated by the two lasers simultaneously, hence leading to an on-chip fusion of the different parts of the Raman spectrum. It is shown that the resulting data are suitable for quantitative evaluation using univariate and multivariate methods. Dual-wavelength Raman fusion spectroscopy offers new opportunities for building highly compact devices for analytical chemistry.