A pilot study of half-value layer measurements using a semiconductor dosimeter for intraoral radiography.

Shun Nouchi Hidenori Yoshida Yusaku Miki Yasuhito Tezuka Ruri Ogawa Ichiro Ogura

Published in: Imaging science in dentistry (2023)

This pilot study examined the relationship between aluminum plate thickness and HVL measurements using a semiconductor dosimeter for intraoral radiography. Semiconductor dosimeters may prove useful in HVL measurement for purposes such as quality assurance in dental X-ray imaging.

Keyphrases

room temperature
high resolution
image quality
cone beam computed tomography
optical coherence tomography
oral health
mass spectrometry
photodynamic therapy