Counting on the future: fast charge-integrating detectors for X-ray nanoimaging.

Junjing Deng Antonino Miceli Chris Jacobsen

Published in: Journal of synchrotron radiation (2023)

A fast charge-integrating detector has been showcased for high-resolution X-ray ptychography. The advancement in developing detectors of this kind, with rapid framing capabilities, holds paramount significance in harnessing the full potential of emerging diffraction-limited synchrotron sources for X-ray nanoimaging.

Keyphrases

high resolution
dual energy
electron microscopy
mass spectrometry
big data
magnetic resonance
solar cells
current status
high speed
magnetic resonance imaging
machine learning
risk assessment
artificial intelligence
sensitive detection