Footprints of scanning probe microscopy on halide perovskites.
Shresth GuptaSayan BhattacharyyaPublished in: Chemical communications (Cambridge, England) (2024)
Scanning probe microscopy (SPM) and advanced atomic force microscopy (AFM ++ ) have become pivotal for nanoscale elucidation of the structural, optoelectronic and photovoltaic properties of halide perovskite single crystals and polycrystalline films, both under ex situ and in situ conditions. These techniques reveal detailed information about film topography, compositional mapping, charge distribution, near-field electrical behaviors, cation-lattice interactions, ion dynamics, piezoelectric characteristics, mechanical durability, thermal conductivity, and magnetic properties of doped perovskite lattices. This article outlines the advancements in SPM techniques that deepen our understanding of the optoelectronic and photovoltaic performances of halide perovskites.
Keyphrases
- solar cells
- atomic force microscopy
- high speed
- high resolution
- single molecule
- living cells
- quantum dots
- room temperature
- electron microscopy
- ionic liquid
- mass spectrometry
- genome wide
- single cell
- highly efficient
- molecularly imprinted
- gene expression
- reduced graphene oxide
- fluorescent probe
- health information
- dna methylation
- social media
- metal organic framework
- optical coherence tomography
- carbon nanotubes