Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography.
Nathan HughesKaren AskewCallum P ScotsonKevin WilliamsColin SauzeFiona CorkeJohn H DoonanCandida NibauPublished in: Plant methods (2017)
Being able to quickly measure plant phenotypes in a non-destructive manner is crucial to advance our understanding of gene function and the effects of the environment. We report on the development of an image analysis pipeline capable of accurately and reliably extracting spike and grain traits from crops without the loss of positional information. This methodology was applied to the analysis of wheat spikes can be readily applied to other economically important crop species.
Keyphrases
- genome wide
- computed tomography
- dual energy
- dna methylation
- climate change
- positron emission tomography
- copy number
- high resolution
- magnetic resonance imaging
- health information
- gene expression
- image quality
- contrast enhanced
- genome wide identification
- magnetic resonance
- mass spectrometry
- genetic diversity
- cell wall
- electron microscopy