Tight relationship between two photosystems is robust in rice leaves under various nitrogen conditions.

Leaf nitrogen (N) level affects not only photosynthetic CO 2 assimilation, but also two photosystems of the photosynthetic electron transport. The quantum yield of photosystem II [Y(II)] and the non-photochemical yield due to the donor side limitation of photosystem I [Y(ND)], which denotes the fraction of oxidized P700 (P700 + ) to total P700, oppositely change depending on leaf N level, and the negative correlation between these two parameters has been reported in leaves of plants cultivated at various N levels in growth chambers. Here, we aimed to clarify whether this correlation is maintained after short-term changes in leaf N level, and what parameters are the most responsive to the changes in leaf N level under field conditions. We cultivated rice varieties at two N fertilization levels in paddy fields, treated additional N fertilization to plants grown at low N, and measured parameters of two photosystems of mature leaves. In rice leaves under low N condition, the Y(ND) increased and the photosynthetic linear electron flow was suppressed. In this situation, the accumulation of P700 + can function as excess energy dissipation. After the N addition, both Y(ND) and Y(II) changed, and the negative correlation between them was maintained. We used a newly-developed device to assess the photosystems. This device detected the similar changes in Y(ND) after the N addition, and the negative correlation between Y(ND) and photosynthetic O 2 evolution rates was observed in plants under various N conditions. This study has provided strong field evidence that the Y(ND) largely changes depending on leaf N level, and that the Y(II) and Y(ND) are negatively correlated with each other irrespective of leaf N level, varieties and annual variation. The Y(ND) can stably monitor the leaf N status and the linear electron flow under field conditions.