Utilizing trapped charge at bilayer 2D MoS 2 /SiO 2 interface for memory applications.

In this work we use conductive atomic force microscopy (cAFM) to study the charge injection process from a nanoscale tip to a single isolated bilayer 2D MoS 2 flake. The MoS 2 is exfoliated and bonded to ultra-thin SiO 2 /Si substrate. Local current-voltage ( IV ) measurements conducted by cAFM provides insight in charge trapping/de-trapping mechanisms at the MoS 2 /SiO 2 interface. The MoS 2 nano-flake provides an adjustable potential barrier for embedded trap sites where the charge is injected from AFM tip is confined at the interface. A window of (Δ V ∼ 1.8 V) is obtain at a reading current of 2 nA between two consecutive IV sweeps. This is a sufficient window to differentiate between the two states indicating memory behavior. Furthermore, the physics behind the charge entrapment and its contribution to the tunneling mechanisms is discussed.