Time-of-flight secondary ion tandem mass spectrometry depth profiling of organic light-emitting diode devices for elucidating the degradation process.

The true compound distributions have been determined using MS/MS depth profiling methods. The results suggest that luminance decay is mainly due to the decomposition and diffusion of OLED compounds, and that OLED decomposition may be accelerated by adventitious hydrocarbons present at the ITO surface.