Probing energy dissipation in molecular-scale junctions via surface enhanced Raman spectroscopy: vibrational pumping and hot carrier enhanced light emission.

Experimentally resolving the microscopic energy dissipation and redistribution pathways in a molecular-scale junction, the smallest possible nanoelectronic device, is of great current interest. Here we report measurements of the vibrational pumping and light emission processes in current-carrying molecular junctions using surface enhanced Raman spectroscopy. We show that the heating of vibrational modes exhibits distinct features when the molecular junctions are driven by electrical bias or optical power. We further discuss the hot carrier origin of the broadband continuum emission observed in the Raman scattering spectrum.