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Surface Recombination and Space-Charge-Limited Photocurrent-Voltage (PC-V) Measurements in (Cd,Mn)Te Samples-Kinetics of Photocurrent (PC).

Andrzej MycielskiDominika M KochanowskaAneta WardakKrzysztof GościńskiMichał SzotWitold DobrowolskiGabriela JanuszMałgorzata GórskaŁukasz JaniakWiesław CzarnackiŁukasz ŚwiderskiJoanna Iwanowska-HankeMarek Moszyński
Published in: Sensors (Basel, Switzerland) (2022)
Photocurrent-voltage characteristic (PC-V) is a method of determining the critical parameter in X-ray and gamma-ray detector plates, i.e., the carrier mobility-lifetime product, μτ . We show for the (Cd,Mn)Te samples that the measurement results depend strongly on the surface treatment and the space charge distribution. The PC-V characteristics obtained for ħω > E g and ħω ~ E g indicated that etching with 20% HCl caused an appearance of a significant concentration of very shallow surface traps at the (Cd,Mn)Te sample surface. These traps seriously changed the results of measurements of PC-V characteristics and PC kinetics. We also noticed a small contribution of holes to photoconductivity in the PC kinetics. The measurements of PC-V characteristics for ħω > E g may test the detector plate surface quality.
Keyphrases
  • computed tomography
  • magnetic resonance imaging
  • high resolution
  • magnetic resonance
  • transition metal
  • mass spectrometry
  • dna damage
  • nk cells
  • image quality
  • metal organic framework