Assessing serial dependence in ordinal patterns processes using chi-squared tests with application to EEG data analysis.

We extend Elsinger's work on chi-squared tests for independence using ordinal patterns and investigate the general class of m-dependent ordinal patterns processes, to which belong ordinal patterns processes derived from random walk, white noise, and moving average processes. We describe chi-squared asymptotically distributed statistics for such processes that take into account necessary constraints on ordinal patterns probabilities and propose a test for m-dependence, with which we are able to quantify the range of serial dependence in a process. We apply the test to epilepsy electroencephalography time series data and observe shorter m-dependence associated with seizures, suggesting that the range of serial dependence decreases during those events.