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Resonant X-ray emission spectroscopy using self-seeded hard X-ray pulses at PAL-XFEL.

Tae Kyu ChoiJaeku ParkGyujin KimHoyoung JangSang Youn ParkJang Hyeob SohnByoung Ick ChoHyunjung KimKyung Sook KimInhyuk NamSae Hwan Chun
Published in: Journal of synchrotron radiation (2023)
Self-seeded hard X-ray pulses at PAL-XFEL were used to commission a resonant X-ray emission spectroscopy experiment with a von Hamos spectrometer. The self-seeded beam, generated through forward Bragg diffraction of the [202] peak in a 100 µm-thick diamond crystal, exhibited an average bandwidth of 0.54 eV at 11.223 keV. A coordinated scanning scheme of electron bunch energy, diamond crystal angle and silicon monochromator allowed us to map the Ir Lβ 2 X-ray emission lines of IrO 2 powder across the Ir L 3 -absorption edge, from 11.212 to 11.242 keV with an energy step of 0.3 eV. This work provides a reference for hard X-ray emission spectroscopy experiments utilizing self-seeded pulses with a narrow bandwidth, eventually applicable for pump-probe studies in solid-state and diluted systems.
Keyphrases
  • high resolution
  • solid state
  • dual energy
  • electron microscopy
  • computed tomography
  • mass spectrometry
  • energy transfer
  • case control
  • electron transfer