An apparatus for probing multipactor in X-band waveguide components.

Rectangular waveguides are susceptible to avalanche-style breakdown via the multipactor phenomenon. The growth in secondary electron density produced via multipactor can damage and destroy RF components. A pulse-adjustable, hard-switched modulator powering an X-band magnetron was utilized to drive a modular experimental setup that enables testing different surface geometries and coatings. Power measurements, taken via diodes, and phase measurements, facilitated via a double-balanced mixer, were integrated into the overall apparatus enabling multipactor detection with high sensitivity and nanosecond temporal resolution. The utilized 150 kW peak microwave source with 2.5 μs pulse width and 100 Hz repetition frequency allows for threshold testing without the need for initial electron seeding. This paper includes the initial results of surface conditioning of the test multipactor gap via electron bombardment.