Genome-wide association study reveals new loci for yield-related traits in Sichuan wheat germplasm under stripe rust stress.

Xueling YeJian LiYukun ChengFangjie YaoLi LongYuqi WangYu WuJing LiJirui WangQiantao JiangHouyang KangWei LiPengfei QiXiujin LanJian MaYaxi LiuYunfeng JiangYuming WeiXianming ChenChunji LiuYouliang ZhengYouliang Zheng

Published in: BMC genomics (2019)

QTLs and candidate genes detected in our study for yield-related traits under stripe rust stress will facilitate elucidating genetic basis of yield-related trait and could be used in marker-assisted selection in wheat yield breeding.

Keyphrases

genome wide
genome wide association study
dna methylation
gene expression
stress induced
heat stress
genome wide association