Corrigendum: Identifying single electron charge sensor events using wavelet edge detection (2015 Nanotechnology 26 215201).

Jonathan R PranceB J Van BaelC B SimmonsD E SavageM G LagallyMark FriesenS N CoppersmithM A Eriksson

Published in: Nanotechnology (2021)

The simulated noise used to benchmark wavelet edge detection in this work was described incorrectly. The correct description is given here, and new results based on noise that matches the original description are provided. The results support our original conclusion, which is that wavelet edge detection outperforms thresholding in the presence of white noise and 1/ f noise.

Keyphrases

air pollution
loop mediated isothermal amplification
real time pcr
label free
convolutional neural network
machine learning