Suppressing Formation of Buried Defects during Annealing Enables Bright Perovskite Light-Emitting Diodes.
Bo SongYang TangXiaomeng LiFanwen MengChang GaoJiamin ChangZhidong LouYufeng HuFeng TengLiang QinYan-Bing HouPublished in: ACS applied materials & interfaces (2024)
Poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) is a promising hole-transporting material for perovskite light-emitting diodes (PeLEDs). However, intrinsic luminance quenching at the PEDOT:PSS/perovskite interface causes deterioration of performance. Here, we develop a facile and effective strategy to passivate the interface defects via the modification of PEDOT:PSS by l-norvaline. As a pre-buried additive, l-norvaline not only reacts with PEDOT:PSS, but also forms the coordination and hydrogen bond with perovskite. We demonstrated that the generation of buried defects at the PEDOT:PSS/perovskite interface originates from the crystallization process of the perovskite film during annealing by in-situ photoluminescence measurements. The surface of l-norvaline-modified PEDOT:PSS can passivate the interfacial defects and inhibit exciton quenching. As a result, the PeLED shows a good device performance with a luminance of 80089 cd m -2 at 509 nm and an external quantum efficiency of 13.04%.