Degradation of Deoxynivalenol in Wheat by Double Dielectric Barrier Discharge Cold Plasma: Identification and Pathway of Degradation Products.
Min ZhangZhumiao YeChangrui XingHongJuan ChenJianhao ZhangWenjing YanPublished in: Journal of the science of food and agriculture (2022)
Applying DDBD to wheat could effectively reduce the level of DON contamination, which provided a theoretical basis for applying cold plasma to the degradation of DON in wheat. This article is protected by copyright. All rights reserved.