Cluster secondary ion emission of silicon: An influence of the samples' dimensional features.
Alexander TolstogouzovMikhail N DrozdovSergey F BelykhGennady P GololobovAlexei E IeshkinPaul MazarovDmitriy V SuvorovDejun FuVasiliy PelenovichXiaomei ZengWenbin ZuoPublished in: Rapid communications in mass spectrometry : RCM (2019)
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