Feasibility and utility of intraoperative epicardial scar characterization during left ventricular assist device implantation.
Joshua D MossAdam OesterleMichael RaimanErin E FlatleyAndrew D BeaserValluvan JeevanandamLiviu KleinTakeyoshi OtaGeorg WieselthalerNir UrielDalise Yi ShatzPublished in: Journal of cardiovascular electrophysiology (2018)
Intraoperative high-density epicardial mapping during LVAD implantation is safe and efficient, facilitating characterization of a potentially arrhythmogenic substrate. An increased burden of the epicardial scar may be associated with a higher incidence of postimplant VA. The role of empiric intraoperative epicardial ablation to mitigate risk of postimplant VA requires further study.