In situ observation of void evolution in 1,3,5-triamino-2,4,6-trinitrobenzene under compression by synchrotron radiation X-ray nano-computed tomography.

The formation and development of voids in 1,3,5-triamino-2,4,6-trinitrobenzene crystals under compression were characterized in situ by X-ray nano-computed tomography. Benefiting from high spatial resolution (30 nm) and excellent imaging contrast, the X-ray nano-computed tomography images revealed the presence of a small fraction of inhomogeneous structures in the original crystal (volume ratio ∼1.2%). Such an inhomogeneity acts as a nucleation of voids and produces stress concentration during compression, which leads to continuous growth of the voids under loading. Meanwhile, the results further reveal that the developing voids are not isotropic: voids with higher surface roughness and irregular structures are easier to break and form new micro-voids. These new voids with higher irregular structures are weaker and easier to break into smaller ones compared with the originals, leading to the development of voids along these weak zones. Finally large voids form. The experiments allow direct investigation of void formation and development, which helps in studying the mechanisms of void development and energetic materials deterioration during manufacturing and transporting.