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Accurate prediction of X-ray pulse properties from a free-electron laser using machine learning.

Alvaro Sanchez-GonzalezP MicaelliC OlivierT R BarillotM IlchenA A LutmanA MarinelliTimothy J MaxwellA AchnerM AgåkerN BerrahC BostedtJ D BozekJ BuckP H BucksbaumS Carron MonteroB CooperJ P CryanM DongR FeifelL J FrasinskiH FukuzawaA GallerG HartmannN HartmannW HelmlA S JohnsonAndré KnieA O LindahlJ LiuK MotomuraM MuckeC O'GradyJ-E RubenssonE R SimpsonR J SquibbC SåtheK UedaMorgane VacherD J WalkeV ZhaunerchykR N CoffeeJ P Marangos
Published in: Nature communications (2017)
Free-electron lasers providing ultra-short high-brightness pulses of X-ray radiation have great potential for a wide impact on science, and are a critical element for unravelling the structural dynamics of matter. To fully harness this potential, we must accurately know the X-ray properties: intensity, spectrum and temporal profile. Owing to the inherent fluctuations in free-electron lasers, this mandates a full characterization of the properties for each and every pulse. While diagnostics of these properties exist, they are often invasive and many cannot operate at a high-repetition rate. Here, we present a technique for circumventing this limitation. Employing a machine learning strategy, we can accurately predict X-ray properties for every shot using only parameters that are easily recorded at high-repetition rate, by training a model on a small set of fully diagnosed pulses. This opens the door to fully realizing the promise of next-generation high-repetition rate X-ray lasers.
Keyphrases
  • high resolution
  • electron microscopy
  • dual energy
  • machine learning
  • risk assessment
  • magnetic resonance imaging
  • artificial intelligence
  • high speed
  • electron transfer