Interventricular Septal Thickness on Cardiac CT as a Novel Risk Factor for Conduction Disturbances in Patients Undergoing Transcatheter Aortic Valve Replacement.

Nili Schamroth Pravda Yonatan Shaleve Ygal Plakht Gideon Shafir Tzlil Grinberg Maya Wiessman Yaron AvivHana Vaknin-AssaPablo Codner Gregory Golovchiner Alon Barsheshet Ran Kornowski Arthur Shiyovich Ashraf Hamdan

Published in: Europace : European pacing, arrhythmias, and cardiac electrophysiology : journal of the working groups on cardiac pacing, arrhythmias, and cardiac cellular electrophysiology of the European Society of Cardiology (2024)

Pre-procedural CT assessment of basal IVS thickness is a novel predictive marker for the risk of conduction disturbances following TAVR. The IVS thickness potentially acts as an anatomical barrier protecting the underlying conduction system from mechanical compression during TAVR.

Keyphrases

transcatheter aortic valve replacement
aortic stenosis
aortic valve
optical coherence tomography
patients undergoing
image quality
computed tomography
dual energy
contrast enhanced
left ventricular
positron emission tomography
magnetic resonance imaging
ejection fraction
hypertrophic cardiomyopathy