We investigated artifactual atomic displacements on a Pt (111) surface using annular dark-field (ADF) scanning transmission electron microscopy (STEM) images under ideal conditions with multi-slice image simulation. Pt atomic columns on the surface exhibited artifact displacement. The bright spots shifted slightly toward the interior of the crystal, indicating that ADF imaging underestimates atomic distance measurements on the crystal surface. Multiple peak fitting is an effective method for determining the positions of bright spots and obtaining more accurate atomic positions while reducing the impact of surface-related artifacts. This is important for the measurement of interatomic distances on crystal surfaces, particularly for catalyst particles.
Keyphrases
- electron microscopy
- deep learning
- high resolution
- convolutional neural network
- image quality
- optical coherence tomography
- magnetic resonance
- computed tomography
- magnetic resonance imaging
- mass spectrometry
- room temperature
- solid state
- liquid chromatography
- photodynamic therapy
- atomic force microscopy
- single molecule
- metal organic framework
- visible light