Towards artifact-free AFM image presentation and interpretation.

Atomic force microscopy (AFM) is based upon a simple operational principle. However, the presentation and interpretation of AFM images can easily suffer from consequential artifacts that are easily overlooked. Here we discuss results from AFM and its companion variations AFM-IR (AFM combined with infrared spectroscopy) and PF-QNM (an AFM mode called peak-force quantitative nano-mechanical mapping) by imaging "bee" structures in asphalt binder (bitumen) as examples. We show how common problems manifest themselves and provide solutions, with the intent that authors can present their results clearly and avoid interpreting artifacts as true physical properties, thereby raising the quality of AFM research. This article is protected by copyright. All rights reserved.