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High frequency characterization of Si 3 N 4 dielectrics for artificial magnetoelectric devices.

Jaianth VijayakumarMarcos GasparLaura MaurelMichael HorisbergerFrithjof NoltingCarlos Antonio Fernandes Vaz
Published in: Journal of materials science (2022)
The online version contains supplementary material available at 10.1007/s10853-022-07832-2.
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