Login / Signup

eC-CLEM: flexible multidimensional registration software for correlative microscopies.

Perrine Paul-GilloteauxXavier HeiligensteinMartin BelleMarie-Charlotte DomartBanafshe LarijaniLucy CollinsonGraça RaposoJean Salamero
Published in: Nature methods (2018)
Keyphrases
  • electron microscopy
  • data analysis
  • psychometric properties
  • solid state