Microwave probe stations with three-dimensional control of the magnetic field to study high-frequency dynamics in nanoscale devices.

We present two microwave probe stations with motorized rotary stages for adjusting the magnitude and angle of the applied magnetic field. In the first system, the magnetic field is provided by an electromagnet and can be adjusted from 0 to ∼1.4 T while its polar angle (θ) can be varied from 0° to 360°. In the second system, the magnetic field is provided by a Halbach array permanent magnet, which can be rotated and translated to cover the full range of polar (θ) and azimuthal (φ) angles with a tunable field magnitude up to ∼1 T. Both systems are equipped with microwave probes, bias-Ts, amplifiers, and spectrum analyzers to allow for microwave characterization up to 40 GHz, as well as software to automatically perform continuous large sets of electrical and microwave measurements.