Detection of sunn pest-damaged wheat grains using artificial bee colony optimization-based artificial intelligence techniques.

Published in: Journal of the science of food and agriculture (2019)

The results indicate that, thanks to the modified ANN algorithm and implemented CFS algorithm, the detection accuracy of damaged wheat grains is considerably increased. © 2019 Society of Chemical Industry.

Keyphrases

artificial intelligence
machine learning
deep learning
big data
loop mediated isothermal amplification
neural network
label free
real time pcr
quantum dots