Three-Dimensional Nanoscale Imaging of SiO2 Nanofiller in Styrene-Butadiene Rubber with High-Resolution and High-Sensitivity Ptychographic X-ray Computed Tomography.
Naru OkawaNozomu IshiguroShuntaro TakazawaHideshi UematsuYuhei SasakiMasaki AbeKyosuke OzakiYoshiaki HonjoHaruki NishinoYasumasa JotiTakaki HatsuiYukio TakahashiPublished in: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada (2024)
SiO2 aggregates in styrene-butadiene rubber (SBR) were observed using ptychographic X-ray computed tomography (PXCT). The rubber composites were illuminated with X-rays focused by total reflection focusing mirrors, and the ptychographic diffraction patterns were collected using a CITIUS detector in the range of -75° to +75° angle of incidence. The projection images of the rubber composites were reconstructed with a two-dimensional resolution of 76 nm, and no significant structural changes were observed during the PXCT measurements. A three-dimensional image of the rubber composite was reconstructed with an isotropic resolution of 98 nm. Segmentation of SiO2 from the SBR, based on a histogram analysis of the phase shift, revealed a fragmented network structure of interconnected SiO2 aggregates.
Keyphrases
- high resolution
- computed tomography
- deep learning
- dual energy
- image quality
- positron emission tomography
- convolutional neural network
- magnetic nanoparticles
- mass spectrometry
- magnetic resonance imaging
- photodynamic therapy
- single molecule
- contrast enhanced
- reduced graphene oxide
- risk factors
- tandem mass spectrometry
- high speed
- optical coherence tomography
- machine learning
- gold nanoparticles
- diffusion weighted
- diffusion weighted imaging