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Van der Waals polarity-engineered 3D integration of 2D complementary logic.

Yimeng GuoJiangxu LiXuepeng ZhanChunwen WangMin LiBiao ZhangZirui WangYueyang LiuKaining YangHai WangWanying LiPingfan GuZhaoping LuoYingjia LiuPeitao LiuBo ChenKenji WatanabeTakashi TaniguchiXing-Qiu ChenChengbing QinJiezhi ChenDong-Ming SunJing ZhangRunsheng WangJianpeng LiuYu YeXiuyan LiYanglong HouWu ZhouHanwen WangZheng Vitto Han
Published in: Nature (2024)
Vertical three-dimensional integration of two-dimensional (2D) semiconductors holds great promise, as it offers the possibility to scale up logic layers in the z axis 1-3 . Indeed, vertical complementary field-effect transistors (CFETs) built with such mixed-dimensional heterostructures 4,5 , as well as hetero-2D layers with different carrier types 6-8 , have been demonstrated recently. However, so far, the lack of a controllable doping scheme (especially p-doped WSe 2 (refs. 9-17 ) and MoS 2 (refs. 11,18-28 )) in 2D semiconductors, preferably in a stable and non-destructive manner, has greatly impeded the bottom-up scaling of complementary logic circuitries. Here we show that, by bringing transition metal dichalcogenides, such as MoS 2 , atop a van der Waals (vdW) antiferromagnetic insulator chromium oxychloride (CrOCl), the carrier polarity in MoS 2 can be readily reconfigured from n- to p-type via strong vdW interfacial coupling. The consequential band alignment yields transistors with room-temperature hole mobilities up to approximately 425 cm 2  V -1  s -1 , on/off ratios reaching 10 6 and air-stable performance for over one year. Based on this approach, vertically constructed complementary logic, including inverters with 6 vdW layers, NANDs with 14 vdW layers and SRAMs with 14 vdW layers, are further demonstrated. Our findings of polarity-engineered p- and n-type 2D semiconductor channels with and without vdW intercalation are robust and universal to various materials and thus may throw light on future three-dimensional vertically integrated circuits based on 2D logic gates.
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