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Optical properties of black silicon structures ALD-coated with Al 2 O 3 .

David SchmelzKristin GeroldThomas KäsebierNatali SergeevAdriana SzeghalmiUwe D Zeitner
Published in: Nanotechnology (2022)
Atomic layer deposited (ALD) Al 2 O 3 coatings were applied on black silicon (b-Si) structures. The coated nanostructures were investigated regarding their reflective and transmissive behaviour. For a systematic study of the influence of the Al 2 O 3 coating, ALD coatings with a varying layer thickness were deposited on three b-Si structures with different morphologies. With a scanning electron microscope the morphological evolution of the coating process on the structures was examined. The optical characteristics of the different structures were investigated by spectral transmission and reflection measurements. The usability of the structures for highly efficient absorbers and antireflection (AR) functionalities in the different spectral regions is discussed.
Keyphrases
  • high resolution
  • highly efficient
  • optical coherence tomography
  • magnetic resonance imaging
  • mass spectrometry
  • atomic force microscopy
  • magnetic resonance
  • single molecule