An investigation of the beam damage effect on in situ liquid secondary ion mass spectrometry analysis.

Xiaofei YuJiachao YuYufan ZhouYanyan ZhangJungang WangJames E EvansXiao-Ying YuXue-Lin WangZihua Zhu

Published in: Rapid communications in mass spectrometry : RCM (2018)

Therefore, beam damage may not be a concern in in situ liquid SIMS analysis if proper experimental conditions are used.

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