Zinc Oxide Defect Microstructure and Surface Chemistry Derived from Oxidation of Metallic Zinc. Thin Film Transistor and Sensoric Behaviour of ZnO Films and Rods.
Rudolf C HoffmannShawn SanctisMaciej O LiedkeMaik ButterlingAndreas WagnerChristian NjelJoerg J SchneiderPublished in: Chemistry (Weinheim an der Bergstrasse, Germany) (2021)
Invited for the cover of this issue is Jörg J. Schneider and co-workers at Technical University Darmstadt, Helmholtz-Zentrum Dresden-Rossendorf and KIT Karlsruhe. The image depicts the application of high energy generated electron/positron couples which are able to detect defects sites in semiconducting zinc oxide thin films. Read the full text of the article at 10.1002/chem.202004270.