Accuracy of non-contact semiconductor X-ray analyzer for quality assurance in intraoral radiography: a comparison with ionization chamber dosimeter.

Shun Nouchi Hidenori Yoshida Yusaku Miki Yasuhito Tezuka Ruri Ogawa Ichiro Ogura

Published in: Oral radiology (2023)

This study indicated the accuracy of a non-contact semiconductor X-ray analyzer for quality assurance in intraoral radiography, especially a comparison with an ionization chamber dosimeter. The semiconductor sensor can be useful for quality assurance in intraoral radiography.

Keyphrases

image quality
room temperature
dual energy
high resolution
cone beam computed tomography
computed tomography
gas chromatography
magnetic resonance imaging
mass spectrometry
tandem mass spectrometry
solid phase extraction