Resonant inelastic soft x-ray scattering on LaPt 2 Si 2 .
Deepak John MukkattukavilJohan HellsvikAnirudha GhoshEvanthia ChatzigeorgiouElisabetta NocerinoQisi WangKarin von ArxShih-Wen HuangVictor EkholmZakir HossainArumugum ThamizhavelJohan ChangMartin MånssonLars NordströmConny SåtheMarcus AgåkerJan-Erik RubenssonYasmine SassaPublished in: Journal of physics. Condensed matter : an Institute of Physics journal (2022)
X-ray absorption and resonant inelastic x-ray scattering spectra of LaPt 2 Si 2 single crystal at the Si 2 p and La 4 d edges are presented. The data are interpreted in terms of density functional theory, showing that the Si spectra can be described in terms of Si s and d local partial density of states (LPDOS), and the La spectra are due to quasi-atomic local 4 f excitations. Calculations show that Pt d -LPDOS dominates the occupied states, and a sharp localized La f state is found in the unoccupied states, in line with the observations.