Magnetotransport Mechanism of Individual Nanostructures via Direct Magnetoresistance Measurement in situ SEM.

The accurate magnetoresistance (MR) measurement of individual nanostructures is essential and important for either the enrichment of fundamental knowledge of the magnetotransport mechanism or the facilitation of desired design of magnetic nanostructures for various technological applications. Herein, we report a deep investigation on the magnetotransport mechanism of a single CoCu/Cu multilayered nanowire via direct MR measurement using our invented magnetotransport instrument in situ scanning electron microscope. Off-axis electron holography experiments united with micromagnetic simulation prove that the CoCu layers in CoCu/Cu multilayered nanowires form a single-domain structure, in which the alignment of magnetic moments is mainly determined by shape anisotropy. The MR of the single CoCu/Cu multilayered nanowire is measured to be only 1.14% when the varied external field is applied along the nanowire length axis, which matches with the theoretical prediction of the granular film model. Density functional theory calculations further disclose that spin-dependent scattering at the interface between magnetic and nonmagnetic layers is responsible for the intrinsic magnetotransport mechanism.