Interventricular septal thickness on cardiac computed tomography as a novel risk factor for conduction disturbances in patients undergoing transcatheter aortic valve replacement.
Nili Schamroth PravdaYonatan ShaleveYgal PlakhtGideon ShafirTzlil GrinbergMaya WiessmanYaron AvivHana Vaknin AssaPablo CodnerGregory GolovchinerAlon BarsheshetRan KornowskiArthur ShiyovichAshraf HamdanPublished in: Europace : European pacing, arrhythmias, and cardiac electrophysiology : journal of the working groups on cardiac pacing, arrhythmias, and cardiac cellular electrophysiology of the European Society of Cardiology (2024)
Pre-procedural CT assessment of basal IVS thickness is a novel predictive marker for the risk of conduction disturbances following TAVR. The IVS thickness potentially acts as an anatomical barrier protecting the underlying conduction system from mechanical compression during TAVR.
Keyphrases
- transcatheter aortic valve replacement
- aortic stenosis
- aortic valve
- computed tomography
- optical coherence tomography
- patients undergoing
- positron emission tomography
- dual energy
- image quality
- left ventricular
- contrast enhanced
- magnetic resonance imaging
- ejection fraction
- heart failure
- cardiac resynchronization therapy
- coronary artery disease