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Low-energy plasma focus device as an electron beam source.

Muhammad Zubair KhanYap Seong LingIbrar YaqoobNitturi Naresh KumarLim Lian KuangWong Chiow San
Published in: TheScientificWorldJournal (2014)
A low-energy plasma focus device was used as an electron beam source. A technique was developed to simultaneously measure the electron beam intensity and energy. The system was operated in Argon filling at an optimum pressure of 1.7 mbar. A Faraday cup was used together with an array of filtered PIN diodes. The beam-target X-rays were registered through X-ray spectrometry. Copper and lead line radiations were registered upon usage as targets. The maximum electron beam charge and density were estimated to be 0.31 μC and 13.5 × 10(16)/m(3), respectively. The average energy of the electron beam was 500 keV. The high flux of the electron beam can be potentially applicable in material sciences.
Keyphrases
  • electron microscopy
  • solar cells
  • monte carlo
  • high resolution
  • high intensity
  • dual energy
  • single cell
  • image quality