Alexandra Delvallée

Scopus Author ID ORCID

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 15

Top Topics

Mass Spectrometry

Atomic Force Microscopy

Top Venues

Nanomaterials (Basel, Switzerland)

Food additives & contaminants. Part A, Chemistry, analysis, control, exposure & risk assessment

Beilstein journal of nanotechnology

This page only lists publications with an associated author ORCID identifier.

Publications

Nicolas Feltin, Alexandra Delvallée, Loïc Crouzier
Strategy for Ensuring the Metrological Traceability of Nanoparticle Size Measurements by SEM. Nanomaterials (Basel, Switzerland) 14 (11) (2024)
Isabel Bastardo-Fernández, Rachida Chekri, Johanna Noireaux, Lucas Givelet, Nora Lambeng, Alexandra Delvallée, Katrin Loeschner, Paola Fisicaro, Petru Jitaru
Characterisation of titanium dioxide (nano)particles in foodstuffs and E171 additives by single particle inductively coupled plasma-tandem mass spectrometry using a highly efficient sample introduction system. Food additives & contaminants. Part A, Chemistry, analysis, control, exposure & risk assessment 41 (8) (2024)
Isabel Bastardo-Fernández, Rachida Chekri, Johanna Noireaux, Lucas Givelet, Nora Lambeng, Alexandra Delvallée, Katrin Loeschner, Paola Fisicaro, Petru Jitaru
Characterisation of titanium dioxide (nano)particles in foodstuffs and E171 additives by single particle inductively coupled plasma-tandem mass spectrometry using a highly efficient sample introduction system. Food additives & contaminants. Part A, Chemistry, analysis, control, exposure & risk assessment (2024)
Nicolas Feltin, Alexandra Delvallée, Loïc Crouzier
Strategy for Ensuring the Metrological Traceability of Nanoparticle Size Measurements by SEM. Nanomaterials (Basel, Switzerland) 14 (11) (2024)
Nicolas Feltin, Alexandra Delvallée, Loïc Crouzier
Strategy for Ensuring the Metrological Traceability of Nanoparticle Size Measurements by SEM. Nanomaterials (Basel, Switzerland) 14 (11) (2024)
Tianjia Bu, Huifang Gao, Yaxuan Yao, Jianfeng Wang, Andrew J Pollard, Elizabeth Legge, Charles A Clifford, Alexandra Delvallée, Sebastien Ducourtieux, Malcolm Lawn, Bakir Babic, Victoria A Coleman, Åsa Jämting, Shan Zou, Maohui Chen, Zygmunt J Jakubek, Erica Iacob, Narin Chanthawong, Kittisun Mongkolsuttirat, Ze Gu, Clara M Almeida, Bo-Ching He, Lachlan Hyde, Lingling Ren
Thickness measurements of graphene oxide flakes using atomic force microscopy:Results of an international interlaboratory comparison. Nanotechnology (2023)
Nicolas Feltin, Loïc Crouzier, Alexandra Delvallée, Francesco Pellegrino, Valter Maurino, Dorota Bartczak, Heidi Goenaga-Infante, Olivier Taché, Sylvie Marguet, Fabienne Testard, Sébastien Artous, François Saint-Antonin, Christoph Salzmann, Jérôme Deumer, Christian Gollwitzer, Richard Koops, Noham Sebaïhi, Richard Fontanges, Matthias Neuwirth, Detlef Bergmann, Dorothee Hüser, Tobias Klein, Vasile-Dan Hodoroaba
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles. Nanomaterials (Basel, Switzerland) 13 (6) (2023)
Nicolas Feltin, Loïc Crouzier, Alexandra Delvallée, Francesco Pellegrino, Valter Maurino, Dorota Bartczak, Heidi Goenaga-Infante, Olivier Taché, Sylvie Marguet, Fabienne Testard, Sébastien Artous, François Saint-Antonin, Christoph Salzmann, Jérôme Deumer, Christian Gollwitzer, Richard Koops, Noham Sebaïhi, Richard Fontanges, Matthias Neuwirth, Detlef Bergmann, Dorothee Hüser, Tobias Klein, Vasile-Dan Hodoroaba
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles. Nanomaterials (Basel, Switzerland) 13 (6) (2023)
Nicolas Feltin, Loïc Crouzier, Alexandra Delvallée, Francesco Pellegrino, Valter Maurino, Dorota Bartczak, Heidi Goenaga-Infante, Olivier Taché, Sylvie Marguet, Fabienne Testard, Sébastien Artous, François Saint-Antonin, Christoph Salzmann, Jérôme Deumer, Christian Gollwitzer, Richard Koops, Noham Sebaïhi, Richard Fontanges, Matthias Neuwirth, Detlef Bergmann, Dorothee Hüser, Tobias Klein, Vasile-Dan Hodoroaba
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles. Nanomaterials (Basel, Switzerland) 13 (6) (2023)
Tianjia Bu, Huifang Gao, Yaxuan Yao, Jianfeng Wang, Andrew J Pollard, Elizabeth J Legge, Charles A Clifford, Alexandra Delvallée, Sebastien Ducourtieux, Malcolm A Lawn, Bakir Babic, Victoria A Coleman, Åsa Jämting, Shan Zou, Maohui Chen, Zygmunt J Jakubek, Erica Iacob, Narin Chanthawong, KittiSun Mongkolsuttirat, Guanghong Zeng, Clara Muniz Almeida, Bo-Ching He, Lachlan Hyde, Lingling Ren
Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison. Nanotechnology 34 (22) (2023)
Tianjia Bu, Huifang Gao, Yaxuan Yao, Jianfeng Wang, Andrew J Pollard, Elizabeth J Legge, Charles A Clifford, Alexandra Delvallée, Sebastien Ducourtieux, Malcolm A Lawn, Bakir Babic, Victoria A Coleman, Åsa Jämting, Shan Zou, Maohui Chen, Zygmunt J Jakubek, Erica Iacob, Narin Chanthawong, KittiSun Mongkolsuttirat, Guanghong Zeng, Clara Muniz Almeida, Bo-Ching He, Lachlan Hyde, Lingling Ren
Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison. Nanotechnology 34 (22) (2023)
François Piquemal, José Morán-Meza, Alexandra Delvallée, Damien Richert, Khaled Kaja
Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy. Nanomaterials (Basel, Switzerland) 11 (3) (2021)
Paul Monchot, Loïc Coquelin, Khaled Guerroudj, Nicolas Feltin, Alexandra Delvallée, Loïc Crouzier, Nicolas Fischer
Deep Learning Based Instance Segmentation of Titanium Dioxide Particles in the Form of Agglomerates in Scanning Electron Microscopy. Nanomaterials (Basel, Switzerland) 11 (4) (2021)
Damien Richert, José Morán-Meza, Khaled Kaja, Alexandra Delvallée, Djamel Allal, Brice Gautier, François Piquemal
Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy. Nanomaterials (Basel, Switzerland) 11 (11) (2021)
Loïc Crouzier, Alexandra Delvallée, Sébastien Ducourtieux, Laurent Devoille, Guillaume Noircler, Christian Ulysse, Olivier Taché, Elodie Barruet, Christophe Tromas, Nicolas Feltin
Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology. Beilstein journal of nanotechnology 10 (2019)