Anna Kafar

Publication Activity (10 Years)

Years Active: 2021-2023
Publications (10 Years): 7

Top Topics

Molecularly Imprinted

Electron Microscopy

Top Venues

Materials (Basel, Switzerland)

This page only lists publications with an associated author ORCID identifier.

Publications

Kiran Saba, Anna Kafar, Jacek Kacperski, Krzysztof Gibasiewicz, Dario Schiavon, Takao Oto, Szymon Grzanka, Piotr Perlin
Monolithic 45 Degree Deflecting Mirror as a Key Element for Realization of 2D Arrays of Laser Diodes Based on AlInGaN Semiconductors. Micromachines 14 (2) (2023)
Kiran Saba, Anna Kafar, Jacek Kacperski, Krzysztof Gibasiewicz, Dario Schiavon, Takao Oto, Szymon Grzanka, Piotr Perlin
Monolithic 45 Degree Deflecting Mirror as a Key Element for Realization of 2D Arrays of Laser Diodes Based on AlInGaN Semiconductors. Micromachines 14 (2) (2023)
Krzysztof Gibasiewicz, Anna Kafar, Dario Schiavon, Kiran Saba, Łucja Marona, Eliana Kamińska, Piotr Perlin
InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit Applications. Micromachines 14 (2) (2023)
Kiran Saba, Anna Kafar, Jacek Kacperski, Krzysztof Gibasiewicz, Dario Schiavon, Takao Oto, Szymon Grzanka, Piotr Perlin
Monolithic 45 Degree Deflecting Mirror as a Key Element for Realization of 2D Arrays of Laser Diodes Based on AlInGaN Semiconductors. Micromachines 14 (2) (2023)
Krzysztof Gibasiewicz, Anna Kafar, Dario Schiavon, Kiran Saba, Łucja Marona, Eliana Kamińska, Piotr Perlin
InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit Applications. Micromachines 14 (2) (2023)
Kiran Saba, Anna Kafar, Jacek Kacperski, Krzysztof Gibasiewicz, Dario Schiavon, Takao Oto, Szymon Grzanka, Piotr Perlin
Monolithic 45 Degree Deflecting Mirror as a Key Element for Realization of 2D Arrays of Laser Diodes Based on AlInGaN Semiconductors. Micromachines 14 (2) (2023)
Dario Schiavon, Robert Mroczyński, Anna Kafar, Grzegorz Kamler, Iryna Levchenko, Stephen Najda, Piotr Perlin
Refractive Index of Heavily Germanium-Doped Gallium Nitride Measured by Spectral Reflectometry and Ellipsometry. Materials (Basel, Switzerland) 14 (23) (2021)